![](assets/img/portfolio/portfolio-daniel.jpg)
Daniel Peters (Dr. Ing.)
Physikalisch-Technische Bundesanstalt (PTB), Germany
![](assets/img/portfolio/portfolio-1.jpg)
Muhammad Azwan Ibrahim (Dr.)
National Metrology Institute of Malaysia (NMIM), Malaysia
![](assets/img/portfolio/jhy.jpg)
Jamaiah Yahaya (Assoc. Prof. Dr.)
Faculty Information Science and Technology (FTSM), UKM, Malaysia
![](assets/img/portfolio/portfolio-4.jpg)
Satoshi Matsuoka (Dr.)
National Metrology Institute of Japan (NMIJ), Japan
![](assets/img/portfolio/portfolio-3.jpg)
Haslina Abdul Kadir (Ms.)
National Metrology Institute of Malaysia (NMIM), Malaysia
![](assets/img/portfolio/portfolio-zhou.jpg)
Zhou Bihong (Ms.)
Shanghai Institute of Measurement and Testing Technology (SIMT), China
![](assets/img/portfolio/Okfalisa.jpg)
Okfalisa (Prof. Dr.)
Universitas Islam Negeri Sultan Syarif Kasim Riau, Indonesia
![](assets/img/portfolio/herb_aten.jpg)
Herb Atens (Mr.)
Mettler Toledo, USA
![](assets/img/portfolio/suresh.jpg)
Suresh Chandra Bose (Mr.)
Mettler Toledo (M) Sdn Bhd, Malaysia